Increasing Spatial Fidelity and SNR of 4D-STEM Using Multi-Frame Data Fusion

4D-STEM, in which the 2D diffraction plane is captured for each scan position scanning transmission electron microscope (STEM) using a pixelated detector, complementing and increasingly replacing existing imaging approaches. However, at present speed of those detectors, although having drastically improved recent years, still 100 to 1,000 times slower than current PMT technology operators are used to. Regrettably, this means environmental scanning-distortion often limits overall performance recorded 4D data. Here we an extension STEM distortion correction techniques treatment 4D-data series. Although applicable general, use ptychography electric-field mapping as model cases demonstrate improvement spatial-fidelity, signal-to-noise ratio (SNR), phase-precision spatial-resolution.